Research > Faculty Projects
Modeling and Simulation of Silicon Wafer Preparation
Principal Investigator
Scott Dunham
Sponsor(s)
North Carolina State University
Award Period
04/01/2000 - 03/31/2009
Abstract
The aim of this work is to develop a comprehensive
gettering simulator, with characterized models for
diffusion, segregation and precipitation of a wide range of
mediated dopant diffusion, impurity-impurity pairing, and
point defect agglomeration (voids, dislocation loops, (311)
defects). The simulator will be developed within a flexible
framework that allows rapid model implementation. The work
will have extensive interactions with other SiWEDS projects
working on experimental gettering studies, and modeling of
precipitation of metals and oxygen.
Updates or corrections to this page should be sent to gheaton@u.washington.edu.
